축적 및 개발 20 년 이상 후, 우리 회사는 기술 혁신과 인재 풀에 분명한 이점이 있습니다. 앞으로는 고객에게 더 나은 제품과 서비스를 제공하기 위해 실제 조치의 속도를 높여야합니다.
의사 짱 -하문 powerway 첨단 재료 공동의 CEO., LTD
pwam은 화합물 반도체 기판 인 갈륨 아세 나이드 결정체와 웨이퍼를 개발 및 제조합니다. 우리는 첨단 결정 성장 기술, 수직 구배 동결 (vgf) 및 가우스 웨이퍼 처리 기술을 사용하고 있으며, 결정 성장, 절단, 연삭에서 연마 가공 및 웨이퍼 청소 및 포장을위한 100 가지 클린 룸. 우리의 gaas 웨이퍼는 led, ld 및 microelectronics 응용 분야에 2 ~ 6 인치 주괴 / 웨이퍼를 포함합니다. 우리는 항상 현재 하위 상태의 품질을 개선하고 대형 기판을 개발하기 위해 노력하고 있습니다.12
pam-xiamen의 gan (질화 갈륨) 기반의 에피 택셜 웨이퍼는 초고 휘도의 청색 및 녹색 발광 다이오드 (LED) 및 레이저 다이오드 (LD) 애플리케이션 용입니다.
갈륨 질화물 (gan) hemts (높은 전자 이동성 트랜지스터)는 rf 전력 트랜지스터 기술의 차세대 기술입니다. 팸 - 샤먼은 현재 사파이어 또는 실리콘에 algan / gan hemt epi 웨이퍼를 제공하고 사파이어 템플릿에는 algan / gan을 제공합니다 .
문의를 통해 무료 서비스를받을 수 있습니다. 25 개 이상의 경험 반도체 라인.
우리의 목표는 모든 요구 사항을 충족시키는 것입니다. 아무리 작은 주문이라도 과 얼마나 어려운 질문 자격을 갖춘 제품과 만족스러운 서비스를 통해 모든 고객에 대해 지속적이고 수익성있는 성장을 유지할 수 있습니다.
~ 이상 25 년 이상 경험담 화합물 반도체 소재 분야 및 수출 사업에서 우리 팀은 고객의 요구 사항을 이해하고 전문적으로 프로젝트를 처리 할 수 있음을 보증 할 수 있습니다.
품질이 최우선입니다. 팸 - 시아 먼은 iso9001 : 2008 는 고객의 다양한 니즈를 충족시킬 수있는 상당량의 검증 된 제품을 제공 할 수있는 4 가지 근대적 인 면모를 소유하고 공유하며 모든 주문은 엄격한 품질 시스템을 통해 처리되어야합니다. 테스트 보고서는 각 선적마다 제공되며 각 웨이퍼는 보증 대상입니다.12
Poly-Si crystals are mainly used in solar cells because of their low cost. Here, the zones of sensitivity to wavelengths in sunlight should be expanded to increase the engineering efficiency of solar cells. Group IV compound semiconductors films, e.g., Si (Ge) films doped with C, Ge (C, Si), and/or Sn atoms with contents of several %, on a Si or Ge substrate have been identified as potential solutions to this technical problem. In this study, we calculated the formation energy of each atomic configuration of C, Ge, and Sn atoms in Si by using density functional theory. The "Hakoniwa" method proposed by Kamiyama et al. [Materials Science in Semiconductor Processing, 43, 209 (2016)] was applied to a 64-atom supercell of Si including up to three atoms of C, Ge, and/or Sn (up to 4.56%) in order to obtain the ratio of each atomic configuration and the average value of the Si bandgaps. Not only the conventional generalized gradient approximation (GGA) but also the screened-exchange local-den...
더 읽기Source:IOPscience For more information, please visit our website: www.semiconductorwafers.net, send us email at sales@powerwaywafer.com or powerwaymaterial@gmail.com
더 읽기The optical transmission, temperature-dependence of the photoluminescence (PL), and Raman scattering of porous SiC prepared from p-type 6H-SiC are compared with those from bulk p-type 6H-SiC. While the transmission spectrum of bulk SiC at room temperature reveals a relatively sharp edge corresponding to its band gap at 3.03 eV, the transmission edge of porous SiC (PSC) is too wide to determine its band gap. It is believed that this wide edge might be due to surface states in PSC. At room temperature, the PL from PSC is 20 times stronger than that from bulk SiC. The PL PSC spectrum is essentially independent of temperature. The relative intensities of the Raman scattering peaks from PSC are largely independent of the polarization configuration, in contrast to those from bulk SiC, which suggests that the local order is fairly random. Source:IOPscience For more information, please visit our website: www.semiconductorwafers.net, send us email at sales@powerwaywafer.com&...
더 읽기The optical transmission, temperature-dependence of the photoluminescence (PL), and Raman scattering of porous SiC prepared from p-type 6H-SiC are compared with those from bulk p-type 6H-SiC. While the transmission spectrum of bulk SiC at room temperature reveals a relatively sharp edge corresponding to its band gap at 3.03 eV, the transmission edge of porous SiC (PSC) is too wide to determine its band gap. It is believed that this wide edge might be due to surface states in PSC. At room temperature, the PL from PSC is 20 times stronger than that from bulk SiC. The PL PSC spectrum is essentially independent of temperature. The relative intensities of the Raman scattering peaks from PSC are largely independent of the polarization configuration, in contrast to those from bulk SiC, which suggests that the local order is fairly random. Source:IOPscience For more information, please visit our website: www.semiconductorwafers.net, send us email at sales@powerwaywafer.com&...
더 읽기1−y alloy as the annealing source.
더 읽기In this study, an InP layer was transferred onto a Si substrate coated with a thermal oxide, through a process combining ion-cutting process and selective chemical etching. Compared with conventional ion-cutting of bulk InP wafers, this layer transfer scheme not only takes advantage of ion- cutting by saving the remaining substrates for reuse, but also takes advantage of selective etching to improve the transferred surface conditions without using the chemical and mechanical polishing. An InP/InGaAs/InP heterostructure initially grown by MOCVD was implanted with H+ ions. The implanted heterostructure was bonded to a Si wafer coated with a thermal SiO2 layer. Upon subsequent annealing, the bonded structure exfoliated at the depth around the hydrogen projected range located in the InP substrate. Atomic force microscopy showed that after selective chemical etchings on the as-transferred structure, a final structure of InP/SiO2/Si was obtained with a relatively smooth surface. Source:IOPsc...
더 읽기We review our recent efforts on developing HgCdSe infrared materials on GaSb substrates via molecular beam epitaxy (MBE) for fabricating next generation infrared detectors with features of lower production cost and larger focal plane array format size. In order to achieve high-quality HgCdSe epilayers, ZnTe buffer layers are grown before growing HgCdSe, and the study of misfit strain in ZnTe buffer layers shows that the thickness of ZnTe buffer layer needs to be below 300 nm in order to minimize the generation of misfit dislocations. The cut-off wavelength/alloy composition of HgCdSe materials can be varied in a wide range by varying the ratio of Se/Cd beam equivalent pressure during the HgCdSe growth. Growth temperature presents significant impact on the material quality of HgCdSe, and lower growth temperature leads to higher material quality for HgCdSe. Typically, long-wave infrared HgCdSe (x=0.18, cut-off wavelength of at 80 K) presents an electron mobility as high as&nbs...
더 읽기Wet etching is an important step in the manufacturing of semiconductor and solar wafers and for the production of MEMS devices. While it has been replaced by the more precise dry etching technology in advanced semiconductor device fabrication, it still plays an important role in the manufacture of the silicon substrate itself. It is also used for providing stress relief and surface texturing of solar wafers in high volume. The technology of wet etching silicon for semiconductor and solar applications will be reviewed. Impact on this step for wafer properties and critical parameters (flatness, topology and surface roughness for semiconductor wafers, surface texture and reflectance for solar wafers) will be presented. The rationale for the use of a etching technology and etchant for specific applications in semiconductor and solar wafer manufacturing will be presented. Source:IOPscience For more information, please visit our website: www.semiconductorwafers.net, send us email at&nbs...
더 읽기4H-SiC homoepitaxial films were grown on 8° off-axis porous 4H-SiC (0001) faces in the temperature range of by chemical vapor deposition from bis(trimethylsilyl)methane (BTMSM) precursor. The activation energy for growth was 5.6 kcal/mol, indicating that the film growth is dominated by the diffusion-limited mechanism. Triangular stacking faults were incorporated in the SiC thin film grown at low temperature of 1280°C due to the formation of 3C-SiC polytype. Moreover, super-screw dislocations appeared seriously in the SiC film grown below 1320°C. Clean and featureless morphology was observed in the SiC film grown below 25 standard cubic centimeters per minute (sccm) carrier gas flow rate of BTMSM at 1380°C while 3C-SiC polytype with double positioning boundaries grew at 30 sccm flow rate of BTMSM. The dislocation density of the epi layer was strongly influenced by the growth temperature and flow rate of BTMSM. Double axis crystal X-ray diffraction and optical micro...
더 읽기During the last decade, the use of single crystal germanium (Ge) layers and structures in combination with silicon (Si) substrates has led to a revival of defect research on Ge. In Si crystals, dopants and stresses affect the intrinsic point defect (vacancy V and self-interstitial I) parameters and thus change the thermal equilibrium concentrations of V and I Source:IOPscience For more information, please visit our website: www.semiconductorwafers.net, send us email at sales@powerwaywafer.com or powerwaymaterial@gmail.com
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